Nikon XT H 225 / 320 / 450
The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects.
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The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. Nikon Metrology is the only company to produce 320kV microfocus X-ray sources. As the X-ray spot size of these sources is orders of magnitude smaller compared to minifocus sources, end users benefit from superiorresolution, accuracy and a wider array of measurable parts.
With the optional rotation reflection target, an even higher X-ray flux is available enabling customers to obtain faster CT data acquisition or achieve higher CT data accuracy in the same time span
Key benefits
- Proprietary 225/320kV microfocus X-ray source
- Run highly accurate inspection on dense industrial objects
- Easy system operation and low cost-of-ownership
- Stunning images providing great insight
- High performance image acquisition and volume processing
- Straightforward inspection automation
- Safety first
Categories: Computed Tomography
Applications: Mobile phones, shavers & watches , Metal Manufacturing, Implants/ Protheses, Streamlining vehicle pre-production, Plastic Manufacturing, Cracks and Failure Analysis, Automated measurement, Aircraft Component Inspection,Composites, Critical assemblies of medical devices or drug delivery systems, Manual examination, Automotive Components Inspection, Dental applications, Die and Mould Applications, Metal corrosion mechanisms, Cosmetics,Household appliances and white goods , Implant research, Unveiling mysteries of nature, Damage propagation in composite material, Rocks/Minerals, Metallurgy
Superior accuracy and performance through proprietary 225 or 320kV micro-focus X-ray source
The default 225kV microfocus source is equipped with a reflection target, offering a 3 micron spot size. With the optional transmission target, you obtain an even smaller spot size and higher magnification capability.
The 320kV microfocus source is used to penetrate through larger or denser samples.
Regardless of the target of choice, the XT H LC system uses an open-tube X-ray source that guarantees a lower cost-of-ownership
Rotating reflection target multiplies X-ray flux
Traditional X-ray sources using fixed targets can only receive a limited flux of electrons to avoid damaging the target. By introducing a rotating reflection target that yields much better cooling performance, the electron flux on the rotating target radically increases without the risk for permanent damage. This boosts X-ray flux by a large factor, and enables customers to obtain faster CT data acquisition or achieve higher CT data accuracy in the same time span
By establishing up to 5 times more X-ray flux, customers can either speed up data acquisition by a similar factor or increase data accuracy by taking more radiographs in the same time.
Stunning images from internal structures
A small spot size and a high-resolution flat panel create sharp images. Adapt resolution to your needs: full part in coarse resolution and high resolution in a desired region of interest.
The XT H LC systems feature a large access door and the heavyduty precision 5-axis manipulator can hold samples in excess of 50kg with dimensions of 0.6m (H) x 0.6m (D).
Safety first
Full protective enclosure – compliant to CE and DIN 54113 radiation safety standards – requires no special badges or protective clothing. Continuous fail-to-safe monitoring during system operation. Radiation shielding is to better than 1µSv/hour external, and dual fail-safe switches/relays ensure safe operation
Configure the system to your specific needs
Specific applications require more detailed images or higher accuracy. XT H 225 can be configured with different flat panels (Varian, Perkin Elmer) or source configuration (reflection/ transmission target) to make the system ideally suited for your needs.
| XT H 225 | XT H 225 ST | XT H 225/320 LC | |
| X-Ray Source (Standard): | 225kV Microfocus Reflection Target |
225kV Microfocus Reflection Target |
225kV Microfocus Reflection Target |
|---|---|---|---|
| X-Ray Source (Option): | 180kV Microfocus Transmission Target Rotating Target |
180kV Microfocus Transmission Target 225kV Rotating Target |
320kV Module 225kV Rotating Target |
| Maximum kV: | 180kV/ 225kV | 180kV/ 225kV | 225kV/ 320 kV |
| Power Rating: | 225W | 225W | 225W/ 320 W (320kV Module) |
| X-Ray Spot Size: | 180kV Transmission Target: 1µm 225kV Reflection Target: 3μm |
180kV Transmission Target: 1µm 225kV Reflection Target: 3μm |
225kV Reflection Target: 3μm 320kV Module: 20μm |
| Geometric Magnification: | > 150x | > 150x | > 150x |
| Imaging System (Standard): | Varian 2520 Flat Panel Detector |
Varian 2520 Flat Panel Detector |
Varian 2520 Flat Panel Detector |
| Imaging System (Option): | Perkin Elmer 0820 Flat Panel Detector Varian 4030 Flat Panel Detector |
Varian 4030 Flat Panel Detector Perkin Elmer 1620 Flat Panel Detector Perkin Elmer 1621 EHS Flat Panel Detector |
Varian 4030 Flat Panel Detector Perkin Elmer 1620 Flat Panel Detector Perkin Elmer 1621 EHS Flat Panel Detector |
| Manipulator (Standard): | 5 Axes | 5 Axes | 4 Axes |
| Axes Travel: | (X) 185mm (Y) 280mm (Z) 730mm (Tilt) +/- 30° (Rotate) n*360° |
(X) 300mm (Y) 350mm (Z) 750mm (Tilt) +/- 30° (Rotate) n*360° |
(X) 500mm (Y) 600mm (Z) 780mm (Rotate) n*360° |
| Manipulator (Option): | n.a. | n.a. | Additional Tilt Axis |
| Max. Sample Weight: | 15 kg | 50 kg | 100 kg |
| Cabinet Dimensions (LxWxH): | 1,830mm x 875mm x 1,987mm | 2,330mm x 1,285mm x 2,230mm | 2,695mm x 2,366mm x 1,834mm |
| Weight: | 2,400 kg | 4,200 kg | 8,000 kg |
| Safety: | All Nikon Metrology X-ray systems are manufactured to IRR99 | All Nikon Metrology X-ray systems are manufactured to IRR99 | All Nikon Metrology X-ray systems are manufactured to IRR99 |
| Control: | All Nikon Metrology X-Ray systems are controlled by Nikon Metrology's in-house Inspect-X software |
All Nikon Metrology X-Ray systems are controlled by Nikon Metrology's in-house Inspect-X software |
All Nikon Metrology X-Ray systems are controlled by Nikon Metrology's in-house Inspect-X software |
| Common System Options: | Advanced High Speed Reconstruction Workstation | Advanced High Speed Reconstruction Workstation | Advanced High Speed Reconstruction Workstation |
| Common System Options | Multi Metal Target (UltraFocus Reflecton Target Only) Advanced Filter Kit (UltraFocus Reflection Target Only) |
Multi Metal Target (UltraFocus Reflecton Target Only) Advanced Filter Kit (UltraFocus Reflection Target Only) |
Multi Metal Target (UltraFocus Reflecton Target Only) Advanced Filter Kit (UltraFocus Reflection Target Only) |
Cod produs: Nikon XT H 225
The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects.