The versatile XT H 225 system offers a powerful microfocus X-ray source, a large inspection volume, high image resolution and is ready for ultrafast CT reconstruction.
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The versatile XT H 225 system offers a powerful microfocus X-ray source, a large inspection volume, high imageresolution and is ready for ultrafast CT reconstruction. They cover a wide range of applications, including the inspection of small castings, plastic parts and complex mechanisms as well as researching materials and natural specimens.

The default microfocus source is equipped with a reflection target, offering a 3 micron spot size. With the optional transmission target, you obtain an even smaller spot size and higher magnification capability. Regardless of the target of choice, the XT H 225 system uses an open-tube X-ray source that guarantees a lower cost-of-ownership
A small spot size and a high-resolution flat panel create sharp images. Adapt resolution to your needs: full part in coarse resolution and high resolution in a desired region of interest.

The core of the processing power is situated in the XT software suite that builds on Nikon Metrology’s track record of improving sample throughput and simplifying operation to take the systems out of the hands of experts and into the hands of users. XT Software also brings the fastest reconstruction of CT data currently available on a single PC. This PC is built from standard components to aid serviceability. The sample throughput can be improved further by the use of additional PCs. The complete system is also readyfor any market leading CT visualization and processing software, such as VolumeGraphics.

Users are operational with the system within a few days days of training. A CT wizard guides operators through the data acquisition process.
Customizable macros automate the measurement workflow, and tight integration with industry-standard post-processing applications streamline the decision making process. Customizable macros automate the measurement workflow, and tight integration with industry-standard post-processing applications streamline the decision making process.
Full protective enclosure – compliant to CE and DIN 54113 radiation safety standards – requires no special badges or protective clothing. Continuous fail-to-safe monitoring during system operation. Radiation shielding is to better than 1µSv/hour external, and dual fail-safe switches/relays ensure safe operation

The open X-ray tube allows for local maintenance of internal tube components. The 3-wheel transportation incorporated to easily maneuver through double-door entries. Also no special floor treatment is to install XT H 225.

Specific applications require more detailed images or higher accuracy. XT H 225 can be configured with different flat panels (Varian, Perkin Elmer) or source configuration (reflection/ transmission target) to make the system ideally suited for your needs.
XT H 225ST system is an extended version to hold larger samples up to 50kg with a diameter of about 50cm.
| XT H 225 | XT H 225 ST | XT H 225/320 LC | |
| X-Ray Source (Standard): | 225kV Microfocus Reflection Target |
225kV Microfocus Reflection Target |
225kV Microfocus Reflection Target |
| X-Ray Source (Option): | 180kV Microfocus Transmission Target Rotating Target |
180kV Microfocus Transmission Target 225kV Rotating Target |
320kV Module 225kV Rotating Target |
| Maximum kV: | 180kV/ 225kV | 180kV/ 225kV | 225kV/ 320 kV |
| Power Rating: | 225W | 225W | 225W/ 320 W (320kV Module) |
| X-Ray Spot Size: | 180kV Transmission Target: 1µm 225kV Reflection Target: 3μm |
180kV Transmission Target: 1µm 225kV Reflection Target: 3μm |
225kV Reflection Target: 3μm 320kV Module: 20μm |
| Geometric Magnification: | > 150x | > 150x | > 150x |
| Imaging System (Standard): | Varian 2520 Flat Panel Detector |
Varian 2520 Flat Panel Detector |
Varian 2520 Flat Panel Detector |
| Imaging System (Option): | Perkin Elmer 0820 Flat Panel Detector Varian 4030 Flat Panel Detector |
Varian 4030 Flat Panel Detector Perkin Elmer 1620 Flat Panel Detector Perkin Elmer 1621 EHS Flat Panel Detector |
Varian 4030 Flat Panel Detector Perkin Elmer 1620 Flat Panel Detector Perkin Elmer 1621 EHS Flat Panel Detector |
| Manipulator (Standard): | 5 Axes | 5 Axes | 4 Axes |
| Axes Travel: | (X) 185mm (Y) 280mm (Z) 730mm (Tilt) +/- 30° (Rotate) n*360° |
(X) 300mm (Y) 350mm (Z) 750mm (Tilt) +/- 30° (Rotate) n*360° |
(X) 500mm (Y) 600mm (Z) 780mm (Rotate) n*360° |
| Manipulator (Option): | n.a. | n.a. | Additional Tilt Axis |
| Max. Sample Weight: | 15 kg | 50 kg | 100 kg |
| Cabinet Dimensions (LxWxH): | 1,830mm x 875mm x 1,987mm | 2,330mm x 1,285mm x 2,230mm | 2,695mm x 2,366mm x 1,834mm |
| Weight: | 2,400 kg | 4,200 kg | 8,000 kg |
| Safety: | All Nikon Metrology X-ray systems are manufactured to IRR99 | All Nikon Metrology X-ray systems are manufactured to IRR99 | All Nikon Metrology X-ray systems are manufactured to IRR99 |
| Control: | All Nikon Metrology X-Ray systems are controlled by Nikon Metrology's in-house Inspect-X software |
All Nikon Metrology X-Ray systems are controlled by Nikon Metrology's in-house Inspect-X software |
All Nikon Metrology X-Ray systems are controlled by Nikon Metrology's in-house Inspect-X software |
| Common System Options: | Advanced High Speed Reconstruction Workstation | Advanced High Speed Reconstruction Workstation | Advanced High Speed Reconstruction Workstation |
| Common System Options | Multi Metal Target (UltraFocus Reflecton Target Only) Advanced Filter Kit (UltraFocus Reflection Target Only) |
Multi Metal Target (UltraFocus Reflecton Target Only) Advanced Filter Kit (UltraFocus Reflection Target Only) |
Multi Metal Target (UltraFocus Reflecton Target Only) Advanced Filter Kit (UltraFocus Reflection Target Only) |